Furukawa Electric Develops New Semiconductor Tape that Can Significantly Improve Semiconductor Quality|2017|News Release|Furukawa Electric Co., Ltd.
Figure 3 from Single & multi beam laser grooving process parameter development and die strength characterization for 40nm node low-K/ULK wafer | Semantic Scholar
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Figure 1 from Laser grooving characterization for dicing defects reduction and its challenges | Semantic Scholar
Advanced Dicing Technologies for Combination of Wafer to Wafer and Collective Die to Wafer Direct Bonding
Figure 14 from Review of wafer dicing techniques for via-middle process 3DI/TSV ultrathin silicon device wafers | Semantic Scholar